Add high-throughput test
authorDavid Goulet <dgoulet@efficios.com>
Tue, 27 Mar 2012 20:04:27 +0000 (16:04 -0400)
committerDavid Goulet <dgoulet@efficios.com>
Tue, 27 Mar 2012 21:43:00 +0000 (17:43 -0400)
This tests high number of events being recorded with multiple concurrent
instrumented applications.

Signed-off-by: David Goulet <dgoulet@efficios.com>

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