tests/unit/test_utils_parse_time_suffix.cpp

   1 /*
   2  * Copyright (C) 2015 EfficiOS Inc.
   3  *
   4  * SPDX-License-Identifier: GPL-2.0-only
   5  *
   6  */
   7
   8 #include <string.h>
   9 #include <stdio.h>
  10 #include <inttypes.h>
  11
  12 #include <tap/tap.h>
  13
  14 #include <common/utils.hpp>
  15
  16 /* For error.h */
  17 int lttng_opt_quiet = 1;
  18 int lttng_opt_verbose = 3;
  19 int lttng_opt_mi;
  20
  21 namespace {
  22 struct valid_test_input {
  23         const char *input;
  24         uint64_t expected_result;
  25 };
  26
  27 /* Valid test cases */
  28 struct valid_test_input valid_tests_inputs[] = {
  29                 { "0", 0 },
  30                 { "1234", 1234 },
  31                 { "1234us", 1234 },
  32                 { "16ms", 16000 },
  33                 { "128ms", 128000 },
  34                 { "32s", 32000000 },
  35                 { "1m", 60000000 },
  36                 { "20m", 1200000000 },
  37                 { "1h", 3600000000 },
  38                 { "5h", 18000000000 },
  39                 { "00", 0 },
  40                 { "0us", 0 },
  41                 { "0ms", 0 },
  42                 { "0s", 0 },
  43                 { "0m", 0 },
  44                 { "0h", 0 },
  45                 { "00us", 0 },
  46                 { "00ms", 0 },
  47                 { "00s", 0 },
  48                 { "00m", 0 },
  49                 { "00h", 0 },
  50                 { "12ms", 12000 },
  51                 { "3597us", 3597 },
  52                 { "+5", 5 },
  53                 { "08", 8 },
  54                 { "0145us", 145 },
  55 };
  56 const int num_valid_tests = sizeof(valid_tests_inputs) / sizeof(valid_tests_inputs[0]);
  57
  58 /* Invalid test cases */
  59 const char *invalid_tests_inputs[] = {
  60                 "",
  61                 " ",
  62                 "-1",
  63                 "m",
  64                 "4611686018427387904s",
  65                 "0x40M",
  66                 "0x",
  67                 "x0",
  68                 "0xx0",
  69                 "07mm",
  70                 "0xm",
  71                 "0Xs",
  72                 "0x0ss",
  73                 "0a",
  74                 "0B",
  75                 "0x3 s",
  76                 "0xbs ",
  77                 "14ns",
  78                 "0xbs",
  79                 "14ns",
  80                 "14ms garbage after value",
  81                 "0x14s",
  82                 "0u",
  83                 "5mS",
  84                 "5Ms",
  85                 "12ussr",
  86                 "67msrp",
  87                 "14si",
  88                 "12mo",
  89                 "53hi",
  90 };
  91 const int num_invalid_tests = sizeof(invalid_tests_inputs) / sizeof(invalid_tests_inputs[0]);
  92 } /* namespace */
  93
  94 static void test_utils_parse_time_suffix(void)
  95 {
  96         uint64_t result;
  97         int ret;
  98         int i;
  99
 100         /* Test valid cases */
 101         for (i = 0; i < num_valid_tests; i++) {
 102                 char name[256];
 103
 104                 ret = utils_parse_time_suffix(valid_tests_inputs[i].input, &result);
 105                 sprintf(name, "valid test case: %s expected %" PRIu64, valid_tests_inputs[i].input, result);
 106                 ok(ret == 0 && result == valid_tests_inputs[i].expected_result, "%s", name);
 107         }
 108
 109         /* Test invalid cases */
 110         for (i = 0; i < num_invalid_tests; i++) {
 111                 char name[100];
 112
 113                 sprintf(name, "invalid test case: %s", invalid_tests_inputs[i]);
 114
 115                 ret = utils_parse_time_suffix(invalid_tests_inputs[i], &result);
 116                 ok(ret != 0, "%s", name);
 117         }
 118 }
 119
 120 int main(void)
 121 {
 122         plan_tests(num_valid_tests + num_invalid_tests);
 123
 124         diag("utils_parse_time_suffix tests");
 125
 126         test_utils_parse_time_suffix();
 127
 128         return exit_status();
 129 }